X-Ray scattering is one of the most powerful tools in the study of the structure of the wide class of polymeric materials in which partial crystallization occurs. The scattering at wide angles provides information on the unit cell variations, the crystallinity, the crystalline perfection and the orientation of the crystallites, whereas the scattering at small angles is specially suited to a description of the crystalline-amorphous morphology. As a result of scientific advances and industrial interest in polymers, progress in constantly being made in the application of X-ray scattering to these materials. This book describes the current state-of-the-art of the application of X-ray scattering to the study of solid polymer materials. As well as chapters on theory and instrumentation, the book covers subjects concerning the measurement of lattice constants, the crystalline perfection, the degree of crystallinity and the description of preferred orientation. In addition, special emphasis is given to the study of the crystalline morphology with the aid of small-angle X-ray scattering, giving both theoretical background and practical information.

1. The Theory of Coherent X-Ray Scattering. The scattering from one electron. The scattering from many electrons. Fourier transformation and reciprocal space. The Ewald sphere construction. The convolution operation. The Fourier transforms of convolutions and products of functions. General relations involving Fourier transforms. Diffraction by crystals. Powder patterns. Diffraction from non-crystalline substances. 2. Experimental Techniques. Properties of X-ray radiation. X-ray excitation. Absorption of X-ray radiation. X-ray detection. Apparatus. 3. Lattice Constants. Measurement of lattice constants by photographic methods. Measurement of lattice constants from diffractometer line profiles. Unit cell measurements in polymers. Interpretation of unit cell variations. 4. Line Breadth Measurements: Paracrystallinity. Lattice distortions. Distortions of the first kind. The concept of paracrystal: distortions of the second kind. Line broadening analysis. alpha-Relation: natural paracrystals. Fourier transform methods. Instrumental corrections. 5. The X-Ray Determination of the Crystallinity in Polymers. Methods based on external comparison. Methods based on internal comparison. 6. The X-Ray Determination of the Orientation in Polymers. Classification. The X-ray registration of the orientation of crystallites. Pole figures. Specification of orientation. The interpretation of orientation phenomena. 7. The Small-Angle X-Ray Scattering of Polymers. Primary data treatment. Two-phase structures. Particle scattering. Lamellar systems. The small-angle scattering of oriented polymers. (Chapters include an introduction and references). Author Index. Subject Index.