X-ray fluorescence spectrometry (XRF) is a method of "fingerprinting" and identifying solid and liquid samples. Written by the leading international expert in the field, this totally-revised update provides an up-to-the-minute review of the progress of XRF in the last ten years, covering history, design, application, and interpretation.

Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: The history of X-ray fluorescence spectrometry-new to this edition. A critical review of the most useful X-ray spectrometers. Techniques and procedures for quantitative and qualitative analysis. Modern applications and industrial trends. X-ray spectra-new to this edition.

Production and Properties X--Rays. Industrial Applications of X--Rays. X--Ray Diffraction. X--Ray Spectra. History and Development of X--Ray Fluorescence Spectrometry. Instrumentation for X--Ray Spectrometry. Comparison of Wavelength and Energy Dispersive Spectrometers. More Recent Trends in X--Ray Fluorescence Instrumentation. Specimen Preparation and Presentation. Use of X--Ray Spectrometry for Qualitative Analysis. Considerations in Quantitative X--Ray Fluorescence Analysis. Quantitative Procedures in X--Ray Fluorescence Analysis. Applications of X--Ray Methods. Index.