This text covers the following areas: phase characterization using diffraction methods; correction factors in powder diffraction; Rietveld method application; X-ray stress analysis; and more.

This volume covers the following areas: phase characterization using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-ray stress analysis; phase transitions and the particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.

Crystallography and stability of martensitic phases in Cu-Zn-Al shape memory alloys, M. Ahlers
powder diffraction and epitaxy, J. Fiala
phase transitions in (NH4)3H(SeO4)2, K. Lukaszewicz
modern powder diffraction applied to the study of thermal behaviour of solids - example of cerium (IV) nitrades, D. Louer
a new multilayer optic for parallel-beam applications, H. Goebel
phase characterization using the full diffraction trace, D. Smith
integrated substructure analysis in textured metallic materials
investigation of strongly distorted crystal structures by means of neutron diffraction, P. Klimanek
small-angle X-ray scattering studies of disordered solids, P.W. Schmidt
peculiarities of Martensite transformations and parameter of the SME in Fe-base and B2 type base alloys, Yu Koval
formation of macropores and mesopores in silica sol-gel system, K. Nakanishi
extinction in hexamethylenetetramine, T. Sabine
the bainitic transformation in Cu-Zn-Mn alloys, T. Czeppe
investigation of texture inhomogeneity in near-surface-layers, J. Bonarski. (Part Contents).