This should be of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools.

This should be of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvement in scientific and technical knowledge and in instrumentation quality as well as a better use of advanced mathematical tools and in the development of new ones. In this book, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming more and more important in industrial processes.

Parameter estimation as illposed inverse problems - theory and numerical methods, K. Kunisch
wavelet methods in signal processing, P. Maass
bootstrap technique, P. Ciarlini
the technologically and topologically related surface model - 13 constraints for dimensioning, tolerancing and inspection, A. Clement et al
an approximation method for the linearization of 3D metrology problems, L. Mathieu et al
software problems in calibration service - a case study, D. Richter et al
reference data sets for testing software used in metrology, M.G. Cox et al
quality of experimental data in hydrodynamic research, M. Masia et al
mathematical methods for data analysis in medical applications, J. Honerkamp
dipole estimation for MCG-data, E. Krause
identification of distributed parameters - an overview, J. Sprekels
robust alternatives to least squares, W. Stahel
high-dimensional empirical linear prediction, K. Liu
and other papers. (Part contents).