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1999 International Symposium on Defect and Fault-Tolerance in Vlsi Systems (Dft 99)
Conference Proceedings
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1999 International Symposium on Defect and Fault-Tolerance in Vlsi Systems (Dft 99)
Paperback ISBN: 9780769503257
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These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.
| ISBN | 76950325 |
| ISBN13 | 9780769503257 |
| Publisher | I.E.E.E.Press |
| Format | Paperback |
| Publication date | 30/11/1999 |
| Pages | 375 |
| Weight (grammes) | 260.00 |
| Published in | United States |
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