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10th Annual Symposium on Physical and Failure Analysis of Integrated Circuits (Ipfa)
You are here: Technology, Engineering, ... > Electronics & Communicati... > Electronics Engineering > Circuits & Components
- Description
- Reviews
- Book Details
This CD-ROM covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliability; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
| ISBN | 780377230 |
| ISBN13 | 9780780377233 |
| Publisher | I.E.E.E.Press |
| Format | CD-ROM |
| Publication date | 30/09/2003 |
| Pages | |
| Weight (grammes) | 270.00 |
| Published in | United States |
| Height (mm) | |
| Width (mm) |






