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10th Annual Symposium on Physical and Failure Analysis of Integrated Circuits (Ipfa)
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10th Annual Symposium on Physical and Failure Analysis of Integrated Circuits (Ipfa)
Paperback ISBN: 9780780377226
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This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
| ISBN | 780377222 |
| ISBN13 | 9780780377226 |
| Publisher | I.E.E.E.Press |
| Format | Paperback |
| Publication date | 30/09/2003 |
| Pages | 300 |
| Weight (grammes) | 260.00 |
| Published in | United States |
| Height (mm) | 297 |
| Width (mm) | 214 |
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